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Atomic Force Microscope (AFM)

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Product Detail

Test Service

Atomic Force Microscope (AFM)

Instrument Model

NT-MDT Prima, Bruker Dimension Edge, Bruker Dimension ICON, Agilent 5500

Test Content

Morphology, PFM, EFM, KPFM,


Sample Type



1. Sample requirements:

(1) For film/bulk sample:

  • Length/Width: 0.5-3 cm; Thickness: 0.1-1 cm;
  • Surface Roughness: < 5 μm
  • Please mark the test surface.

(2) For powder series sample:

Type of Powder series

Required Weight Per Sample


≥ 20 mg, particle size < 5 μm

Powder in solvent

≥ 1 mL

Powder prepared on silicon slice

Length/Width: 0.5-3 cm

2. Powder sample preparation instructions: The powder is dispersed in XX solvent (usually ethanol or deionized water) and dropped onto the mica sheet/silicon slice for drying.

3. Please download and print the order form and send it with the sample after the order is completed.

4. All samples are non-returnable and please contact us if you have special requests.

Disclaimer: ACS Material LLC believes that the information on our website is accurate and represents the best and most current information available to us. ACS Material makes no representations or warranties either express or implied, regarding the suitability of the material for any purpose or the accuracy of the information listed here. Accordingly, ACS Material will not be responsible for damages resulting from use of or reliance upon this information.