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Transmission Electron Microscope (TEM)

As low as $0.00 $0.00
In stock
SKU# ATTEM

Product Detail

Schematic of Transmission Electron Microscope

Test Service

Transmission Electron Microscope (TEM)

Instrument Model

FEI Tecnai F20, TF30, JEOL JEM 2100F, FEI Talos F200X

Test Content

EDS, Mapping, STEM, EELS

Sample Type

Liquid/Powder/Film*/Bulk*

Lead Time

2~3 weeks

*Film and bulk cannot be directly tested and need some preparation (ion thinning, double spraying, focused ion beam (FIB) and section, etc.). If these preparation are required, please contact us and confirm in advance.


Notes:

1. Sample Requirements:
  • For liquid sample: ≥ 5 mL.
  • For powder sample: ≥ 5 mg.
2. Sample Composition Requirements:
  • Safety: Non-toxic and Non-radioactive.
  • Organics: Unable to perform Mapping test on samples with organics.
  • Magnetic: Some materials are easily magnetized after being exposed to a magnetic field, and the magnetic enhancement after heating is also defined as a magnetic sample.Please confirm whether the sample is magnetic or not and list in the order form.
3. We will try our best to test, but there is no guarantee that the expected results will be obtained. This goes especially for magnetic samples or poorly conductive samples. We appreciate your understanding.

4. The SCALE can be reached to 5 nm usually, but the photo quality is closely related to the sample condition.

5. Please download and print the order form and send it with the sample after the order is completed.

6. All samples are non-returnable and please contact us if you have special requests.


Disclaimer: ACS Material, LLC believes that the information in this Technical Data Sheet is accurate and represents the best and most current information available to us. ACS Material makes no representations or warranties either express or implied, regarding the suitability of the material for any purpose or the accuracy of the information contained within this document. Accordingly, ACS Material will not be responsible for damages resulting from use of or reliance upon this information.