External Adjustable Probe Stage AECH400V-EM/EB
Product Detail
Product Composition
Main Unit
Photo of InSitu Pro™ AECH400V-EM
Photo of InSitu Pro™ AECH400V-EB
Product Features
InSitu Pro™ AECH400V-EM and AECH400V-EB are specifically designed for temperature-dependent electrical property testing of samples, enabling the characterization of how a material’s electrical performance varies with temperature. Based on an optical thermal stage, this system integrates an electrical module—including probes, displacement mechanisms, and electrical interfaces.
AECH400V-EM uses a built-in positioning stage, adjusted via a micrometer head.
AECH400V-EB uses an external positioning stage, connected via a bellows.
By adjusting the probe position, precise contact between the probe tip and any desired area on the sample surface can be achieved. Electrical signals are transmitted through the probe, signal wires, and interfaces to external measuring instruments (such as a source meter or digital multimeter) to collect relevant data, allowing for in-depth analysis of the material’s electrical characteristics at different temperatures.
Depending on the probe holder design, the system is available in versions with internally adjustable probes, externally adjustable probes, and electrically controlled adjustable probes.
This product series features ultra-wide-range precision temperature control. Based on the target temperature and specific application requirements, a variety of advanced temperature control solutions are available, including liquid helium cooling, liquid nitrogen cooling, thermoelectric cooling, resistive heating, infrared heating, and laser heating—providing powerful support for complex temperature variation experiments.
Compatible Instruments
The system is designed to integrate with a wide range of optical and electrical instruments.
Software Integration
Multi-language SDKs (e.g., LabVIEW, C#) are available to enable efficient and customized system integration.
Product Specifications
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InSitu Pro™ External Adjustable Probe Stage |
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Model # |
AECH400V-EM |
AECH400V-EB |
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SKU# |
EIEVCH4M |
EIEVCH4B |
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Heating/ Cooling Method |
Liquid nitrogen cooling, Resistive heating |
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Temperature Range |
-190° C~400° C |
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Temperature Stability |
±0.1℃ |
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Temperature Control Rate |
Maximum heating rate: 150 °C/min; Maximum cooling rate: 40 °C/min |
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Sample Stage |
Silver; 23 x 23 mm |
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Optical Path |
Reflective |
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Top Window Size |
f25 x 1 mm |
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Window Material |
quartz glass (transmission wavelength range: 220 nm–2500 nm), manually removable and replaceable |
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Dist. From Top Window to Sample Stage Surface |
25 mm |
16.5 mm |
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Chamber Height |
20.5 mm |
15 mm |
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Probe |
Tungsten carbide gold-plated coaxial probe x 4 |
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Probe Adjustment |
XYZ axis travel: ±6mm |
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Probe Interface |
Triple Coaxial BNC x 4 |
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Sample Stage Surface Potential |
Grounded / electrically floating sample stage |
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Chamber |
Vacuum |
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Dimensions |
436 x 436 x 132 mm |
430 x 430 x 60 mm |
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New Weight |
13.5kg |
10.5kg |
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Basic Configuration |
1 x main unit, 1 x temperature controller, 1 x cooling controller, 1 x liquid nitrogen tank, 1 x water circulation system, 1 x software |
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Disclaimer: ACS Material, LLC believes that the information on this website is accurate and represents the best and most current information available to us. ACS Material makes no representations or warranties either express or implied, regarding the suitability of the material for any purpose or the accuracy of the information contained within this document. Accordingly, ACS Material will not be responsible for damages resulting from use of or reliance upon this information.